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Electron Probe Microanalysis

Identification and measurement of ELEMENTS and their location based on the fact that X-RAYS emitted by an element excited by an electron beam have a wavelength characteristic of that element and an intensity related to its concentration. It is performed with an electron microscope fitted with an x-ray spectrometer, in scanning or transmission mode.
推出的年份: 1970(1967)
副标题
树号: E01.370.350.515.402.250, E05.196.867.800.360, E05.595.402.250, E05.799.830.360
MeSH 单一 ID: D004577
进入的组:
  • Electron Probe Microanalyses
  • Microanalyses, Electron Probe
  • Probe Microanalyses, Electron
  • Probe Microanalysis, Electron
  • Microscopy, Electron, X-Ray Microanalysis
  • Spectrometry, X Ray Emission, Electron Microscopic
  • Spectrometry, X Ray Emission, Electron Probe
  • Spectrometry, X-Ray Emission, Electron Microscopic
  • X-Ray Microanalysis, Electron Probe
  • X Ray Microanalysis, Electron Probe
  • X Ray Emission Spectrometry, Electron Microscopic
  • X Ray Emission Spectrometry, Electron Probe
  • X-Ray Emission Spectrometry, Electron Microscopic
  • X-Ray Emission Spectrometry, Electron Probe
  • X-Ray Microanalysis
  • Microanalysis, X-Ray
  • X Ray Microanalysis
  • X-Ray Microanalysis, Electron Microscopic
  • X Ray Microanalysis, Electron Microscopic
  • Microanalysis, Electron Probe
  • Spectrometry, X-Ray Emission, Electron Probe
早前的内容:
  • Electrons (1966)
  • Spectrum Analysis (1966)

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