MeSH 搜索器

Microscopy, Electron

Microscopy using an electron beam, instead of light, to visualize the sample, thereby allowing much greater magnification. The interactions of ELECTRONS with specimens are used to provide information about the fine structure of that specimen. In TRANSMISSION ELECTRON MICROSCOPY the reactions of the electrons that are transmitted through the specimen are imaged. In SCANNING ELECTRON MICROSCOPY an electron beam falls at a non-normal angle on the specimen and the image is derived from the reactions occurring above the plane of the specimen.
推出的年份:
副标题
树号: E01.370.350.515.402, E05.595.402
MeSH 单一 ID: D008854
进入的组:
  • Electron Microscopy

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