MeSH 搜索器

Microscopy, Atomic Force

A type of scanning probe microscopy in which a probe systematically rides across the surface of a sample being scanned in a raster pattern. The vertical position is recorded as a spring attached to the probe rises and falls in response to peaks and valleys on the surface. These deflections produce a topographic map of the sample.
推出的年份: 1995
副标题
树号: E01.370.350.515.666.400, E05.595.666.400
MeSH 单一 ID: D018625
进入的组:
  • Force Microscopy
  • Force Microscopies
  • Microscopies, Force
  • Microscopy, Force
  • Scanning Force Microscopy
  • Force Microscopies, Scanning
  • Force Microscopy, Scanning
  • Microscopies, Scanning Force
  • Microscopy, Scanning Force
  • Scanning Force Microscopies
  • Atomic Force Microscopy
  • Atomic Force Microscopies
  • Microscopies, Atomic Force
早前的内容:
  • Microscopy (1988-1994)
  • Microscopy, Scanning Tunneling (1988-1994)

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