Scanning probe microscopes have revolutionized our understanding of electronic phenomena by allowing us to visualize them at the atomic scale. However, they only probe the properties of materials at one point at a time. Now, writing in Nature, Shahal Ilani and colleagues present a conceptually new scanning probe microscope, which they call a quantum twisting microscope (QTM). The new instrument can probe the interference between electrons tunnelling into the sample through different paths and enables both momentum-resolved measurements and in situ tuning of the twist angle between 2D materials stacked on top of each other, systems that host fascinating physics.